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Gold Plated Ultra-Fine Precision Spring Test Probe with Customizable Tip Styles for BGA Testing and Semiconductor Applications

Gold Plated Ultra-Fine Precision Spring Test Probe with Customizable Tip Styles for BGA Testing and Semiconductor Applications

Gold Plated Spring Test Probe

Ultra-Fine Precision BGA Testing Probe

Customizable Tip Styles Semiconductor Test Pin

Menşe yeri:

Çin

Marka adı:

WINNER

Sertifika:

ISO9100

Bizimle İletişim
Teklif Et
Ürün Ayrıntıları
Ürün Adı:
Yay testi sondası
varil:
PB, Altın kaplamalı
Alt Piston:
BeCu/SK4,altın kaplama
ÜST Piston:
Pd Alaşımı / Kaplamasız
BAHAR:
SWPB(SUS)/Altın Kaplama
Kullanılabilirlik:
Özel boyutlar mevcut
Kaplama:
Altın kaplama
Mevcut Derecelendirme:
1A
Kontak Direnci:
maksimum 100 mohm
Bant genişliği:
-0,17dB @ 19,6GHz
endüktaz:
1.25nH
Kaptanlık:
1,61pF
Tam vuruş:
1.00mm
İsimlendirilmiş darbe:
0,65 mm
Yay Kuvveti:
30 gram@o.65mm
Mekanik Ömrü Aşıyor:
200k
Vurgulamak:

Gold Plated Spring Test Probe

,

Ultra-Fine Precision BGA Testing Probe

,

Customizable Tip Styles Semiconductor Test Pin

Ödeme ve Nakliye Şartları
Min sipariş miktarı
3000 pc
Fiyat
999
Ambalaj bilgileri
Nötr paketleme veya OEM logosu ile
Teslim süresi
5-8 iş günü
Ödeme koşulları
L/C, Western Union, T/T
Yetenek temini
Ayda 100000 rulo
Ürün Tanımı
High Efficiency BGA Testing Probes
Precision spring-loaded semiconductor test pins designed for reliable performance in demanding testing applications.
Key Product Features
  • Ultra-Fine Precision: 0.11 mm plunger and 0.15 mm barrel for micro-pitch PCB pads, IC leads, flex circuits, and semiconductor testing
  • High Conductivity Gold Plating: Gold-plated plunger and barrel ensure low contact resistance and stable signal transmission
  • Multiple Tip Styles: Available in B tip (60° cone), U tip, D tip, and fully customized geometries
  • Durable Spring Structure: Stainless steel spring (SUS material) provides stable working stroke and reliable contact force
  • Custom Manufacturing: OEM/ODM accepted with fast delivery from our factory
Production Specifications
Gold Plated Ultra-Fine Precision Spring Test Probe with Customizable Tip Styles for BGA Testing and Semiconductor Applications 0
Gold Plated Ultra-Fine Precision Spring Test Probe with Customizable Tip Styles for BGA Testing and Semiconductor Applications 1
Product Images
Gold Plated Ultra-Fine Precision Spring Test Probe with Customizable Tip Styles for BGA Testing and Semiconductor Applications 2
Gold Plated Ultra-Fine Precision Spring Test Probe with Customizable Tip Styles for BGA Testing and Semiconductor Applications 3
Detailed Component Illustration
Gold Plated Ultra-Fine Precision Spring Test Probe with Customizable Tip Styles for BGA Testing and Semiconductor Applications 4
Comparison of different test probe tip types and configurations
Customization Options
SICHUAN WINNER SPECIAL ELECTRONIC MATERIALS CO., LTD. offers comprehensive customization for our brass barrel stainless steel spring test probes:
  • Custom diameters to match your specific requirements
  • Custom plating thicknesses for optimal conductivity and durability
  • Custom mechanical specifications tailored to your application
All products include material traceability documentation and certificate of analysis for quality assurance. Contact us to request samples or a quotation for your specific application requirements.
Manufacturing Process
Gold Plated Ultra-Fine Precision Spring Test Probe with Customizable Tip Styles for BGA Testing and Semiconductor Applications 5
Our probe manufacturing facility
Gold Plated Ultra-Fine Precision Spring Test Probe with Customizable Tip Styles for BGA Testing and Semiconductor Applications 6
Quality control inspection
Gold Plated Ultra-Fine Precision Spring Test Probe with Customizable Tip Styles for BGA Testing and Semiconductor Applications 7
Packaged probes ready for shipment

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