Name: Dual-Head High-Frequency Gold-Plated Spring Test Probe for IC Testing YF DE2-055BB30-01C0
Brand: SICHUAN WINNER SPECIAL ELECTRONIC MATERIALS CO., LTD.
Price: 999 USD
Availability: InStock

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Dual-Head High-Frequency Gold-Plated Spring Test Probe for IC Testing YF DE2-055BB30-01C0

Dual-Head Spring Test Probe

High-Frequency IC Test Probe

Gold-Plated Pogo Pin

Menşe yeri:

Çin

Marka adı:

WINNER

Sertifika:

ISO9100

Bizimle İletişim

Teklif Et

Dual-Head High-Frequency Gold-Plated Spring Test Probe for IC Testing YF DE2-055BB30-01C0

Ürün Ayrıntıları

Ürün Adı:

Yay testi sondası

varil:

PB, Altın kaplamalı

Alt Piston:

BeCu/SK4,altın kaplama

ÜST Piston:

SK4(Cu Ol)/Altın Kaplama

BAHAR:

SWPB(SUS)/Altın Kaplama

Kullanılabilirlik:

Özel boyutlar mevcut

Kaplama:

Altın kaplama

Mevcut Derecelendirme:

Kontak Direnci:

maksimum 100 mohm

Bant genişliği:

-0,85dB @ 19,6GHz

endüktaz:

1.27nH

Kaptanlık:

1,62pF

Tam vuruş:

1,0 mm

İsimlendirilmiş darbe:

0,65 mm

Yay Kuvveti:

25 gram @ 0,65 mm

Mekanik Ömrü Aşıyor:

200k

Vurgulamak:

Dual-Head Spring Test Probe

High-Frequency IC Test Probe

Gold-Plated Pogo Pin

Ödeme ve Nakliye Şartları

Min sipariş miktarı

3000 pc

Fiyat

999

Ambalaj bilgileri

Nötr paketleme veya OEM logosu ile

Teslim süresi

5-8 iş günü

Ödeme koşulları

L/C, Western Union, T/T

Yetenek temini

Ayda 100000 rulo

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Gold Plated Spring Test Probe with 2A Current Rating and Custom Sizes for PCB Testing

En İyi Fiyatı Alın

Gold Plated Spring Test Probe with 2A Current Rating and Custom Sizes for IC Testing

En İyi Fiyatı Alın

Bizimle İletişim

Şimdi iletişime geçin

Ürün Tanımı

Dual-Head High-Frequency IC Test Probe YF DE2-055BB30-01C0

High Quality Switch Contact Pin Test Probe YF DE2-055BB30-01C0. Precision spring-loaded semiconductor test pins designed for reliable performance in demanding testing applications, featuring high efficiency BGA testing capabilities.

Key Product Features

High Conductivity Gold Plating: Gold-plated plunger and barrel ensure low contact resistance and stable signal transmission
Multiple Tip Styles: Available in B tip (60° cone), U tip, D tip, and fully customized geometries
Durable Spring Structure: Stainless steel spring (SUS material) provides stable working stroke and reliable contact force
Custom Manufacturing: OEM/ODM accepted with fast delivery from our factory

Product Images

Detailed Component Illustration

Comparison of different test probe tip types and configurations

Customization Options

SICHUAN WINNER SPECIAL ELECTRONIC MATERIALS CO., LTD. offers comprehensive customization for our brass barrel stainless steel spring test probes:

Custom diameters to match your specific requirements
Custom plating thicknesses for optimal conductivity and durability
Custom mechanical specifications tailored to your application

All products include material traceability documentation and certificate of analysis for quality assurance. Contact us to request samples or a quotation for your specific application requirements.

Manufacturing Process

Our probe manufacturing facility

Quality control inspection

Packaged probes ready for shipment

Etiketler：

Dual-Head High-Frequency Gold-Plated Spring Test Probe for IC Testing YF DE2-055BB30-01C0

Dual-Head Spring Test Probe

High-Frequency IC Test Probe

Gold-Plated Pogo Pin

Dual-Head Spring Test Probe

High-Frequency IC Test Probe

Gold-Plated Pogo Pin

High Quality Brass Spring Loaded 4 Pin PCB Contact Pin for Electronic Device

Double-head Test Probe Spring Contact Pin for IC Testing YOUFU UF-FTO55FD030-002

Gold Plated Spring Test Probe with 2A Current Rating and Custom Sizes for PCB Testing

Gold Plated Spring Test Probe with 2A Current Rating and Custom Sizes for IC Testing

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